Project overview
X-ray diffraction is the main technique by which scientists and engineers study the structures of crystalline materials, however some sample types are often neglected due to the requirement for specialised instrumentation and expertise. This proposal provides advanced equipment to apply diffraction and related methods to a series of lesser-studied sample types of great importance in technology and in understanding environmental processes. These include thin layers of material on surfaces, where information about atomic separations, particle sizes, crystal orientation and changes in the size of the lattice due to interactions with the underlying material can be obtained. This will be critical to the understanding of a range of functional materials with applications in energy conversion and storage, electronics, optoelectronics and engineering. It will also be possible to study very small regions of a material, this is important in examination of single components or regions of a sample where variations are important in understanding properties. Sample types include minerals, where the structure of individual grains will contribute to knowledge of interactions with the environment, and single components of grids of material designed to have specific interactions with light.
Staff
Lead researchers
Other researchers
Research outputs
Xianji Li, Andrew Lee Hector & John R. Owen,
2014, The Journal of Physical Chemistry C, 118(51), 29568-29573
DOI: 10.1021/jp509385w
Type: article
Katrina Morgan, Ruomeng Huang, Kenneth Potter, Chris Shaw, William Redman-White & Kees de Groot,
2014, IEEE Transactions Nuclear Science, 61(6), 1-6
Type: article
Sophie L. Benjamin, Y. Chang, Chitra Gurnani, Andrew Lee Hector, M. Huggon, William Levason & Gillian Reid,
2014, Dalton Transactions, 43(44), 16640-16648
DOI: 10.1039/c4dt02694b
Type: article
MAURO CALLISTI & T. Polcar,
2014, Surface and Coatings Technology, 254, 260-269
Type: article
Stephen J. Beecher, Tina L. Parsonage, Jacob I. Mackenzie, Katherine A. Sloyan, James A. Grant-Jacob & Robert W. Eason,
2014, Optics Express, 22(18), 22056-22061
DOI: 10.1364/OE.22.022056
Type: article
Sophie L. Benjamin, C.H. de Groot, Chitra Gurnani, Andrew L. Hector, Ruomeng Huang, Elena Koukharenko, William Levason & Gillian Reid,
2014, Journal of Materials Chemistry A, 2(14), 4865-4869
DOI: 10.1039/c4ta00341a
Type: article